globalchange  > 气候变化与战略
DOI: 10.1016/j.tecto.2021.228964
论文题名:
Normal fault growth in continental rifting: Insights from changes in displacement and length fault populations due to increasing extension in the Central Kenya Rift
作者: Shmela A.K.; Paton D.A.; Collier R.E.; Bell R.E.
刊名: Tectonophysics
ISSN: 00401951
出版年: 2021
卷: 814
语种: 英语
中文关键词: Fault growth ; Rift evolution ; Scaling properties ; Strain accommodation
英文关键词: Fractal dimension ; Geologic models ; Population distribution ; Population statistics ; Surveying ; Cumulative distribution ; Digital elevation model ; Displacement distribution ; Fractal dimensions (d) ; Power law distribution ; Scaling relationships ; Strain accommodations ; Strain localizations ; Fault slips ; displacement ; extensional tectonics ; normal fault ; rifting ; strain ; East African Rift ; Kenya ; Kenya Rift
英文摘要: This study examines the scaling relationship between fault length and displacement for the purpose of gaining a better understanding of the evolution of normal faults within the central Kenya Rift. 620 normal faults were manually mapped from a digital elevation model (DEM), with 30 m2 resolution and an estimated maximum displacement of ~40–~6030 m and fault lengths of 1270 ‐ 60,600 m. To assess the contribution of fault populations to the strain accommodation from south to north, the study area has been divided into three zones of fault populations based upon their average fault orientations; zone 1 in the north is dominated by NNE striking faults, zone 2 in the centre of the rift is characterised by NNW to NNE fault trends, whereas zone 3 in the south is characterised by NNW striking fault systems. Extensional strain was estimated by summing fault heaves across six transects along the rift, which showed a progressive increase of strain from south to north. The fault length and displacement data in the three zones fit to a power law distribution. The cumulative distributions of fault length populations showed similar fractal dimension (D) in the three zones. The cumulative displacement distributions for the three zones showed a decrease in the Power-law fractal dimension with increasing strain, which implies that the strain is increasingly localized onto larger faults as the fault system becomes more evolved from south to north. Increasing displacement with increasing strain while the fault length remains almost constant may indicate that the fault system could be evolving in accordance with a constant length fault growth model, where faults lengthen quickly and then accrue displacement. Results of this study suggest that the process of progressively increasing fault system maturity and strain localization onto large faults can be observed even over a relatively small area (240 × 150 km) within the rift system. It is also suggested that patterns of fault growth can be deduced from the fractal dimension of cumulative distribution of fault size populations. © 2021
Citation statistics:
资源类型: 期刊论文
标识符: http://119.78.100.158/handle/2HF3EXSE/170902
Appears in Collections:气候变化与战略

Files in This Item:

There are no files associated with this item.


作者单位: University of Leeds, School of Earth and Environment, United Kingdom; TectonKnow Ltd., Settle, North Yorkshire, United Kingdom; Imperial College London, Department of Earth Science & Engineering, United Kingdom

Recommended Citation:
Shmela A.K.,Paton D.A.,Collier R.E.,et al. Normal fault growth in continental rifting: Insights from changes in displacement and length fault populations due to increasing extension in the Central Kenya Rift[J]. Tectonophysics,2021-01-01,814
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[Shmela A.K.]'s Articles
[Paton D.A.]'s Articles
[Collier R.E.]'s Articles
百度学术
Similar articles in Baidu Scholar
[Shmela A.K.]'s Articles
[Paton D.A.]'s Articles
[Collier R.E.]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[Shmela A.K.]‘s Articles
[Paton D.A.]‘s Articles
[Collier R.E.]‘s Articles
Related Copyright Policies
Null
收藏/分享
所有评论 (0)
暂无评论
 

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.