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journal.pone.0093363.PDF(1089KB) | 期刊论文 | 作者接受稿 | 开放获取 | | View
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作者单位: | Department of Engineering Physics, Electronics and Mechanics, Graduate School of Engineering, Nagoya Institute of Technology, Nagoya, Japan;Helmholtz Institute, Utrecht University, Utrecht, The Netherlands;Helmholtz Institute, Utrecht University, Utrecht, The Netherlands;Department of Engineering Physics, Electronics and Mechanics, Graduate School of Engineering, Nagoya Institute of Technology, Nagoya, Japan
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Recommended Citation: |
Yoshihiro Tanaka,Wouter M. Bergmann Tiest,Astrid M. L. Kappers,et al. Contact Force and Scanning Velocity during Active Roughness Perception[J]. PLOS ONE,2014-01-01,9(3)
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