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Scanner-Based Minirhizotrons Help to Highlight Relations between Deep Roots and Yield in Various Wheat Cultivars under Combined Water and Nitrogen Deficit Conditions [期刊论文]
AGRONOMY-BASEL, 2019-01-01, 9 (6
Postic, Francois;  Beauchene, Katia;  Gouache, David;  Doussan, Claude
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